Review of surface transient charge measurement on solid insulating materials via the Pockels technique

Surface charges accumulated on solid insulating materials in electrical apparatuses and electronic devices could distort the initial electric field severely damage insulation performance. Accurate transient surface charge measurement is critical to determine mechanisms of transport flashover occurrence, estimate strength under high voltage. The technique based Pockels electro-optic effect considered as only approach for 2-D dynamic distribution behaviour so far, it has good capability avoid original distortion caused by conventional methods featured metal probes. This paper reviews recent progress non-invasive systems technique. We focus especially typical with transmitting reflecting configurations frequently used fast inversion algorithms. It can be inferred that higher spatial-temporal resolution, signal-to-noise ratio, better compatibility both transparent opaque are future development trends, which greatly depend multiple technological breakthroughs at impact-resistant crystals, advanced high-speed photography high-performance In addition, studies discharge, together present limitation prospects discussed. expected more ideas will inspired other relevant methods.